H AND D RETENTION IN WNOX FILMS
Published: 6 Sep 2018
Abstract: W is the main wall material in the international fusion device and seeding of N containing gas is under consideration for plasma edge cooling and H isotope removal from the wall. In this environment with residual oxygen gas, it is highly anticipated that WNOx layers are formed on W. Thus, knowledge of H-isotope retention in WNOx layers is important for understanding of H-isotope recycling. Using WNOx (x=0.4±0.2) films prepared on C-plane-cut-sapphire (C-Al2O3) substrate, we have investigated H and D retention, and depth profile of H and D, using D(3He, α)H nuclear reaction analysis (NRA), H(15)O-NRA and elastic recoil detection (ERD). In as-deposited films, we find a high density (0.4x1022 cm-3) of H by 15N -NRA. After low energy D-plasma exposure (~1018 cm-2), we also find a large amount of D-retention (~ 1017 cm-2) by 3He -NRA, as well as high density D by ERD, and that high density of H remains in the film. These results cannot be understood by a simple H-D replacement.
Keywords: wnox, h and d retention, ion beam analysis
Cite this article: N. Matsunami, N. Ohno, M. Tokitani, B. Tsuchiya, M. Sataka. H AND D RETENTION IN WNOX FILMS. Journal of International Scientific Publications: Materials, Methods & Technologies 12, 335-342 (2018). https://www.scientific-publications.net/en/article/1001711/
Download full text
Back to the contents of the volume
© 2023 The Author(s). This is an open access article distributed under the terms of the Creative Commons Attribution License http://creativecommons.org/licenses/by/3.0/
, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. This permission does not cover any third party copyrighted material which may appear in the work requested.